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Automated image processing for grain boundary analysis
Sowmya Mahadevan1, David Casasent
1Department of Electrical and Computer and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA.
Abstract:
The image processing used in the automated analysis of grain boundaries and triple junctions in scanning electron microscopy images is described. The required image processing includes the location of grain boundaries and triple junctions, calculation of the dihedral angles at triple junctions, and selection of electron backscatter probe points (to obtain grain orientation data).
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