Koji Kimoto1, Kazuo Ishizuka, Nobuo Tanaka
1Advanced Materials Laboratory, National Institute for Materials Science (NIMS), Tsukuba, Ibaraki, Japan. kimoto.koji@nims.go.jp
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This study introduces a simple method for coma-free alignment in transmission electron microscopy (TEM) using a single defocused image. The technique precisely aligns the beam, significantly reducing misalignment errors without complex procedures.
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