Related Experiment Videos

An approach to examining model dependence in EM reconstructions using cross-validation.

Tanvir R Shaikh1, Reiner Hegerl, Joachim Frank

  • 1The Wadsworth Center, Empire State Plaza, Albany, NY 12201-0509, USA.

Summary

Cross-validation minimizes reference bias in electron microscopy (EM) 3D-projection matching. This method effectively distinguishes real data from noise, even during iterative refinement, ensuring more reliable reconstructions.

Related Concept Videos