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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Channelling effects in atomic resolution STEM

C J Rossouw1, L J Allen, S D Findlay

  • 1CSIRO Manufacturing and Infrastructure Technology, Private Bag 33, Clayton South MDC, Victoria 3169, Australia. chris.rossouw@csiro.au

Ultramicroscopy
|July 23, 2003
PubMed

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