Related Experiment Video
Updated: Aug 3, 2026

Production of Single Tracks of Ti-6Al-4V by Directed Energy Deposition to Determine the Layer Thickness for Multilayer Deposition
Published on: March 13, 2018
Inversion of thicknesses of multi-layered structures from eddy current testing measurements
1Institute of Advanced Manufacturing Engineering,Zhejiang University, Hangzhou 310027, China. vamadis@yahoo.com.cn
Abstract:
Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.
More Related Videos
06:17Quantifying the Relative Thickness of Conductive Ferromagnetic Materials Using Detector Coil-Based Pulsed Eddy Current Sensors
Published on: January 16, 2020
07:34Layer Microdissection of Tricuspid Valve Leaflets for Biaxial Mechanical Characterization and Microstructural Quantification
Published on: February 10, 2022