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Updated: Aug 12, 2026
Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Theory for the measurements of dispersion characteristics in waveguiding structures with a scanning near-field
Hugo J W M Hoekstra1, Dion J W Klunder, Alfred Driessen
1Integrated Optics and Micro-Systems Group, Microelectronics, Sensors, and Actuators Research Institute, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands. h.j.w.m.hoekstra@el.utwente.nl
Abstract:
A theory is presented for the interpretation of scanning near-field optical microscope measurements on pulses propagating in waveguiding structures. It is shown how the dispersion characteristics of the propagating guided modes may be derived from such experiments. Then it is demonstrated how to calibrate the scanning tip position and to derive experimental values for reflection and transmission of modes in identical single-mode waveguides connected to a photonic device such as a micro cavity.
