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The spatial resolution improvement of EIT images by GVSPM-FOCUSS algorithm

Guoya Dong1, Hesheng Liu, Richard H Bayford

  • 1Department of Electrical Engineering, Hebei University of Technology, Tianjin, 300130, People's Republic of China. dgy99@mails.tsinghua.edu.cn

Summary

The new GVSPM-FOCUSS method enhances electrical impedance tomography (EIT) imaging by combining generalized vector sample pattern matching (GVSPM) with the focal underdetermined system solver (FOCUSS) algorithm. This improves spatial resolution and localization accuracy in EIT reconstructions.

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