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Dispersion of the nonlinear refractive index in sapphire
Arkady Major1, Fumiyo Yoshino, Irkalis Nikolakakos
1Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto M5S 3G4, Canada. a.major@utoronto.ca
Abstract:
The nonlinear refractive index, n2, of sapphire was experimentally measured in the 550-1550-nm wavelength range by use of a picosecond Z-scan technique. It was found that in this spectral region the value of n2 decreases monotonically from approximately 3.3 x 10(-16) to approximately 2.8 x 10(-16) cm2/W. An empirical expression for the wavelength dependence of the nonlinear refractive index in the 270-1550-nm range was obtained.
