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Surface plasmon polariton-based optical beam profiler.

H Ditlbacher1, J R Krenn, A Leitner

  • 1Karl Franzens University and Erwin Schrödinger Institute for Nanoscale Research, Universitätplatz 5, A-8010 Graz, Austria.

Optics Letters
|July 6, 2004
PubMed
Summary
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This study introduces a novel device using surface plasmon polaritons (SPPs) to map light beam intensity. The device converts light to SPPs, enabling precise measurement of optical field profiles for focused light.

Area of Science:

  • Optics and Photonics
  • Materials Science

Background:

  • Measuring the intensity distribution of focused light beams is crucial for various optical applications.
  • Existing methods may face limitations in resolution or complexity.

Purpose of the Study:

  • To present a new device for accurately measuring the intensity distribution of strongly focused light beams.
  • To utilize surface plasmon polaritons (SPPs) for optical field profiling.

Main Methods:

  • A device employing a gold thin film with a sharp step was fabricated.
  • The device was placed in the focal region of a light beam to convert light into SPPs.
  • Directional leakage radiation emitted by SPPs into a glass substrate was analyzed.
  • The thin film's edge was scanned through the focal region to reconstruct the optical field profile.

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Main Results:

  • The intensity of the leakage radiation was found to be directly proportional to the local light intensity at the step.
  • The device successfully enabled the reconstruction of the optical field profile of focused light beams.

Conclusions:

  • The developed SPP-based device offers a sensitive and effective method for measuring focused light intensity distributions.
  • This technique provides a new approach for optical field characterization and metrology.