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Shot noise in linear macroscopic resistors.

G Gomila1, C Pennetta, L Reggiani

  • 1Department d'Electronica and Research Centre for Bioelectronics and Nanobioscience, Universitat de Barcelona, Edifici Modulari, Josep Samitier 1-5, 08028 Barcelona, Spain.

Physical Review Letters
|July 13, 2004
PubMed
Summary

Researchers provide direct evidence of shot noise in macroscopic resistors. This fundamental electronic noise arises from charge carrier fluctuations, even without potential barriers or specific scattering conditions.

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Area of Science:

  • Solid State Physics
  • Condensed Matter Physics
  • Electronic Devices

Background:

  • Shot noise is a fundamental quantum mechanical phenomenon.
  • Typically observed in semiconductor devices, requiring specific conditions like potential barriers.
  • Understanding noise sources is crucial for developing advanced electronic components.

Purpose of the Study:

  • To experimentally demonstrate shot noise in a linear macroscopic resistor.
  • To investigate the underlying physical mechanisms responsible for shot noise in this system.
  • To challenge existing prerequisites for observing shot noise in electronic devices.

Main Methods:

  • Experimental measurement of electrical noise in a macroscopic resistor.
  • Analysis of charge carrier dynamics and diffusive motion.

Related Experiment Videos

  • Correlation of noise characteristics with dielectric relaxation and transit times.

    • Main Results:

    • Direct experimental evidence of shot noise in a linear macroscopic resistor was obtained.
    • Shot noise originates from fluctuations in the total number of charge carriers.
    • These fluctuations are linked to diffusive motion when dielectric relaxation time exceeds dynamic transit time.

    Conclusions:

    • Shot noise can be observed in macroscopic resistors under specific dynamic conditions.
    • Potential barriers and the absence of inelastic scattering are not prerequisites for shot noise.
    • This finding broadens the understanding of noise phenomena in electronic systems.