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Updated: Mar 30, 2026

Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
Published on: January 4, 2016
A Pullia1, H W Kraner1, D P Siddons1
1Brookhaven National Laboratory, Upton, NY 11973-5000, USA.
A new multichannel silicon pad detector achieves excellent energy resolution for Extended X-ray Absorption Fine Structure (EXAFS) applications. Cooling with Peltier cells significantly improves performance, making it suitable for EXAFS spectroscopy.
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