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Novel developments in the MOSFET dosemeter for neutron dosimetry applications
Robert A Price1, Chris Benson, Malcolm J Joyce
1Computational and Applied Dosimetry Research Group, Physics Department, Clatterbridge Centre for Oncology, Bebington, Wirral, Merseyside CH63 4JY, UK. rprice1495@aol.com
Radiation Protection Dosimetry
|September 9, 2004
Summary
This study enhances Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) for neutron dosimetry and radiotherapy. A novel low-activation design using polymeric cement significantly improves neutron sensitivity and reduces unwanted activation.
Area of Science:
- Nuclear Engineering
- Materials Science
- Radiation Detection
Background:
- Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) are explored for neutron dosimetry and radiotherapy applications.
- Conventional MOSFETs face challenges with neutron activation and limited sensitivity in radiation environments.
Purpose of the Study:
- To assess the feasibility of large-geometry MOSFETs for active and passive neutron dosimetry.
- To enhance neutron sensitivity and minimize neutron activation in MOSFET devices for radiotherapy use.
Main Methods:
- Modified standard Dual in-Line MOSFETs with polymeric cement and boron-loaded cement.
- Exposed devices to gamma rays (60Co) and neutrons (gamma-ray shielded 252Cf) for sensitivity and activation analysis.
- Evaluated a unique low-activation device design.
Main Results:
- Neutron sensitivity increased approximately threefold with a thin polymeric cement layer over the gate region.
- The novel low-activation design exhibited essentially zero neutron activation.
- Conventional MOSFETs showed significant activation (1000 cps) under identical neutron exposure.
Conclusions:
- Polymeric cement effectively enhances MOSFET neutron sensitivity for dosimetry and radiotherapy.
- The developed low-activation MOSFET design significantly mitigates neutron-induced activation issues.
- These advancements improve the reliability and safety of MOSFETs in radiation fields.