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Updated: Aug 20, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
06:57

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

Published on: July 17, 2020

HVEM characterization of crack tip dislocations in silicon crystals

Masaki Tanaka1, Kenji Higashida

  • 1Department of Materials Science and Engineering, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan. masaki@dera.zaiko.kyushu-u.ac.jp

Journal of Electron Microscopy
|December 8, 2004
PubMed

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