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Updated: Aug 20, 2026
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites
Kazumi Ozawa1, Sosuke Kondo, Hirotatsu Kishimoto
1Graduate School of Energy Science, Kyoto University, Uji, Kyoto 611-0011, Japan. kazumi@iae.kyoto-u.ac.jp
Journal of Electron Microscopy
|December 8, 2004
Abstract:
The combination of focused ion beam (FIB) micro-processing and the lift-out technique using the micro pick-up system was applied to the preparation of TEM specimens of irradiated SiC/SiC composites. The deformation caused by microstructural evolution was observed in the pyrolitic carbon interphase, and several helium bubbles and cavities were detected in the CVI matrix.
