Ken Harada1, Tetsuya Akashi, Yoshihiko Togawa
1Frontier Research System, The Institute of Physical and Chemical Research (RIKEN), Hatoyama, Saitama 350-0395, Japan. harada@rd.hitachi.co.jp
A new electron interferometry and holography system with two electron biprisms offers enhanced control over fringe spacing and interference width. This novel setup provides greater flexibility for advanced electron microscopy applications.
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