Nanoscale high-frequency contact mechanics using an AFM tip and a quartz crystal resonator

The transmission of high-frequency shear stress through a microscopic contact between an AFM tip and an oscillating quartz plate was measured as a function of vertical pressure, amplitude, and surface properties by monitoring the MHz component of the tip's deflection. For dry surfaces, the transmission of shear stress is proportional to the vertical load across the contact. This provides a measure of the forces of adhesion between the substrate and the tip. When stretching soft polymeric fibers created by pulling on the surface of a pressure sensitive adhesive, the transmitted shear stress decreased linearly with extension over the entire range of pulling. This contrasts with the static adhesive force, which remained about constant until it discontinuously dropped at the point of rupture.