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Wavelength-dispersive device based on a Fourier-transform Michelson-type arrayed waveguide grating.

Pavel Cheben1, Ian Powell, Siegfried Janz

  • 1Institute for Microstructural Sciences, National Research Council of Canada, Ottawa, Ontario, Canada. pavel.cheben@nrc.ca

Optics Letters
|August 12, 2005
PubMed
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We introduce a novel arrayed waveguide grating (AWG) device that functions as a Fourier-transform (FT) spectrometer without scanning. This design enhances light-gathering capability and spectral resolution, improving upon conventional devices.

Area of Science:

  • Photonics
  • Optical Engineering
  • Spectroscopy

Background:

  • Traditional Fourier-transform (FT) spectrometers require scanning elements, limiting their speed and robustness.
  • Arrayed waveguide gratings (AWGs) are typically used for wavelength demultiplexing, not as FT spectrometers.
  • Existing grating-based spectrometers often have limited light-gathering capabilities.

Purpose of the Study:

  • To propose and demonstrate a novel arrayed waveguide grating (AWG) device functioning as a scanning-free Fourier-transform (FT) spectrometer.
  • To enhance the light-gathering capability (etendue) of FT spectrometers while maintaining high spectral resolution.
  • To overcome the limitations of narrow input waveguides in conventional AWGs and grating-based devices.

Main Methods:

  • Design of a new AWG device architecture enabling FT spectroscopy.

Related Experiment Videos

  • Utilizing a silicon-on-insulator platform for device fabrication.
  • Simulating spectral performance with large input aperture sizes (up to 40 microm).
  • Main Results:

    • The proposed AWG device operates as an FT spectrometer without scanning elements.
    • Achieved high spectral resolution of 0.07 nm (approx. 10 GHz).
    • Demonstrated no significant spectral deterioration for aperture widths up to 40 microm, a >50-fold increase compared to conventional devices.

    Conclusions:

    • The novel AWG design offers a scanning-free FT spectrometer with significantly increased etendue.
    • This approach provides a robust and highly sensitive spectroscopic solution.
    • The device is suitable for platforms like silicon-on-insulator, enabling practical implementation.