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Integrated-optic variable delay line and its application to a low-coherence reflectometer.

K Takiguchi1, M Itoh, H Takahashi

  • 1NTT Photonics Laboratories, NTT Corporation, Atsugi, Kanagawa, Japan. taki@aecl.ntt.co.jp

Optics Letters
|October 29, 2005
PubMed
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We developed a novel variable delay line using planar light-wave circuit technology for optical low-coherence reflectometry. This solid-state design eliminates moving parts, enabling precise measurements up to 262.1 mm with high sensitivity.

Area of Science:

  • Photonics and Optical Engineering
  • Interferometry and Reflectometry

Background:

  • Optical low-coherence reflectometry (OLCR) is a key technique for non-invasive depth-resolved measurements.
  • Traditional OLCR systems often rely on mechanical delay lines, limiting scan speed and robustness.
  • Advancements in integrated photonics offer potential for novel, solid-state optical components.

Purpose of the Study:

  • To introduce a large-scale, solid-state variable delay line for OLCR applications.
  • To demonstrate its efficacy as a reference arm in an optical low-coherence reflectometer.
  • To achieve high-resolution, long-range scanning without mechanical components.

Main Methods:

  • Fabrication of a variable delay line using planar light-wave circuit (PLW) technology.
  • Integration of 16 asymmetrical delay arm pairs with optical switches for path selection.

Related Experiment Videos

  • Implementation of the PLW delay line as the reference arm in an optical low-coherence reflectometer setup.

    • Main Results:

    • Successful implementation of a solid-state variable delay line, eliminating the need for moving parts.
    • Achieved a reference arm scan length of 262.1 mm with a step resolution below 1.0 micrometer in air.
    • Demonstrated a reflectometer sensitivity of approximately -47 dB.

    Conclusions:

    • The proposed planar light-wave circuit-based variable delay line is a viable solid-state alternative for optical low-coherence reflectometry.
    • This technology enables high-precision, long-range measurements without mechanical limitations.
    • The developed system offers enhanced robustness and potential for miniaturization in optical sensing applications.