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Published on: April 1, 2020
Read-noise characterization of focal plane array detectors via mean-variance analysis
R P Sperline1, A K Knight, C A Gresham
1Department of Chemistry, University of Arizona, Tucson, AZ 86721, USA.
Abstract:
Mean-variance analysis is described as a method for characterization of the read-noise and gain of focal plane array (FPA) detectors, including charge-coupled devices (CCDs), charge-injection devices (CIDs), and complementary metal-oxide-semiconductor (CMOS) multiplexers (infrared arrays). Practical FPA detector characterization is outlined. The nondestructive readout capability available in some CIDs and FPA devices is discussed as a means for signal-to-noise ratio improvement. Derivations of the equations are fully presented to unify understanding of this method by the spectroscopic community.

