A wide-aperture dynamically focusing sagittal monochromator for X-ray spectroscopy and diffraction
R L Bilsborrow1, P A Atkinson, N Bliss
1CCLRC Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK. r.l.bilsborrow@dl.ac.uk
Journal of Synchrotron Radiation
|December 24, 2005
Summary
A new X-ray monochromator enables ultra-dilute spectroscopy by providing high flux, allowing Extended X-ray Absorption Fine Structure (EXAFS) data collection at parts-per-million concentrations.
Area of Science:
- Materials Science
- Spectroscopy
- X-ray Optics
Background:
- Synchrotron Radiation Source (SRS) beamlines require advanced optics for specialized experiments.
- Ultra-dilute spectroscopy demands high photon flux for sensitive measurements.
Purpose of the Study:
- To report on the implementation and performance of a scanning dynamically focusing sagittal X-ray monochromator.
- To enable high-sensitivity Extended X-ray Absorption Fine Structure (EXAFS) measurements.
Main Methods:
- Utilizing a scanning dynamically focusing sagittal X-ray monochromator on SRS beamline 16.5.
- Employing a 6 T wiggler source and a Si 220 crystal pair.
- Operating within an energy range of 7-27 keV with a horizontal spot size <1.1 mm FWHM.
Main Results:
- Achieved a monochromatic flux of 1 x 10(11) photons s(-1) (100 mA)(-1) at 9 keV.
- Demonstrated capability for EXAFS data collection at concentrations at or below 10 ppm.
- The monochromator is in routine use, indicating operational reliability.
Conclusions:
- The developed X-ray monochromator provides high flux comparable to third-generation sources.
- This technology significantly advances the possibilities for ultra-dilute spectroscopy and trace element analysis.
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