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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

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Field emission tip as a nanometer source of free electron femtosecond pulses

Peter Hommelhoff1, Yvan Sortais, Anoush Aghajani-Talesh

  • 1Physics Department, Stanford University, Stanford, California 94305, USA. hommelhoff@stanford.edu

Physical Review Letters
|April 12, 2006
PubMed

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