Related Experiment Video
Updated: Aug 9, 2026
10:12
Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering
G Bortel1, E E Alp, W Sturhahn
1Advanced Photon Source, Argonne National Laboratory, Argonne IL 60439, USA. gb@szfki.hu
Journal of Synchrotron Radiation
|April 13, 2006
Summary
A new double flat-crystal analyzer enables simultaneous data collection for multiple energy transfers in inelastic X-ray scattering. This X-ray optic offers an alternative to traditional analyzers, providing flexible resolution for advanced experiments.
Area of Science:
- Condensed matter physics
- Materials science
- Spectroscopy
Background:
- Inelastic X-ray scattering (IXS) is a powerful technique for probing elementary excitations in materials.
- Conventional analyzers, like spherical-focusing backscattering analyzers, often require sequential data collection, limiting efficiency.
- There is a need for advanced X-ray optics that can enhance data acquisition speed and offer flexible resolution in IXS experiments.
Purpose of the Study:
- To describe a novel double flat-crystal analyzer designed for inelastic X-ray scattering.
- To demonstrate its capability for simultaneous data collection across a range of energy transfers.
- To evaluate its performance as an alternative to conventional analyzers.
Main Methods:
- Development and characterization of a double flat-crystal analyzer.
- Utilizing the correlation between energy and direction of transmitted X-rays.
- Operation at the copper K edge with a resolution of 120 meV.
Main Results:
- The double flat-crystal analyzer successfully collects data for a range of energy transfers simultaneously.
- Experimental results validate the analyzer's performance at the copper K edge.
- The developed X-ray optic achieves a resolution of 120 meV.
Conclusions:
- The double flat-crystal analyzer presents a viable alternative to conventional spherical-focusing backscattering analyzers.
- This X-ray optic is particularly advantageous for resonant inelastic X-ray scattering (RIXS) experiments.
- It offers enhanced flexibility in energy and momentum resolution for advanced IXS studies.
Related Concept Videos
01:29Determination of Crystal Structures
In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
01:10X-ray Diffraction of Biological Samples
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
02:18X-ray Crystallography
The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
01:26Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.