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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Atomic scale defect analysis in the scanning transmission electron microscope

Ilke Arslan1, Nigel D Browning

  • 1Department of Physics, University of California-Davis, Davis, California 95616, USA. iarslan@sandia.gov

Microscopy Research and Technique
|April 29, 2006
PubMed

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