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Statistical analysis of X-ray speckle at the NSLS
O K Tsui1, S G Mochrie, L E Berman
1Center for Materials Science and Engineering, Massachusetts Institute of Technology,Cambridge, MA 02139, USA.
Journal of Synchrotron Radiation
|May 12, 2006
Summary
Researchers analyzed X-ray speckle patterns from aerogels. They found the X-ray beam
Area of Science:
- Materials Science
- X-ray Physics
- Condensed Matter Physics
Background:
- Disordered materials like aerogels exhibit complex scattering patterns when illuminated.
- Synchrotron light sources provide high-intensity, coherent X-ray beams crucial for probing material structure.
Purpose of the Study:
- To statistically analyze static X-ray speckle patterns from a disordered aerogel.
- To evaluate the coherence properties of the X-ray beam at a specific synchrotron beamline.
Main Methods:
- Illumination of a disordered aerogel sample with a coherent X-ray beam.
- Statistical analysis of the resulting static speckle pattern.
- Comparison of experimental coherence with expected values.
Main Results:
- The delivered coherence at the X25 beamline was found to be within 35% of the expected value.
- The rate of coherent photons was approximately half of that predicted by the source brilliance.
Conclusions:
- The study quantifies the coherence performance of the X25 beamline.
- Findings indicate a lower-than-expected flux of coherent photons, impacting experiments relying on beam coherence.
