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Updated: Aug 8, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A monochromator for scanning X-ray microscopy beamlines at third-generation synchrotron light sources
A new plane-grating monochromator concept is introduced for advanced scanning X-ray microscopy beamlines. This design optimizes performance at synchrotron light sources, accounting for optical aberrations.
Area of Science:
- X-ray Optics
- Synchrotron Radiation Science
- Microscopy
Background:
- Scanning X-ray microscopy requires high-performance monochromators for precise wavelength selection.
- Third-generation synchrotron light sources offer intense X-ray beams crucial for advanced microscopy techniques.
- Existing monochromator designs may not fully address the specific demands of scanning transmission X-ray microscopy (STXM) beamlines.
Purpose of the Study:
- To present a novel concept for a plane-grating monochromator tailored for STXM beamlines.
- To optimize the monochromator design for specific parameters of a beamline at BESSY II.
- To evaluate the performance and potential aberrations of the proposed monochromator design.
Main Methods:
- Conceptual design of a plane-grating monochromator.
- Optimization of optical parameters for a specific STXM beamline at BESSY II.
- Ray-tracing calculations to simulate performance and identify geometric aberrations.
Main Results:
- A feasible plane-grating monochromator design concept is presented.
- The design is optimized for a scanning transmission X-ray microscopy beamline at BESSY II.
- Ray-tracing results quantify potential geometric aberrations inherent in the beamline optics.
Conclusions:
- The proposed plane-grating monochromator offers a viable solution for enhancing STXM capabilities.
- The design optimization and aberration analysis provide a foundation for experimental implementation.
- This work contributes to the advancement of X-ray microscopy instrumentation at synchrotron facilities.
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