X-ray diffraction structure analysis of MCM-48 mesoporous silica.

Leonid A Solovyov1, Oleg V Belousov, Robert E Dinnebier

  • 1Institute of Chemistry and Chemical Technology, 660049 Krasnoyarsk, Russia. leosol@icct.ru

Summary

This study used X-ray diffraction to analyze the structure of MCM-48 mesoporous silica. The researchers found that the pore wall thickness was consistently 8.0(1) Angstrom in both as-made and calcined samples. They also observed that the density in low-curvature regions was about 10% higher than in other areas. The surfactant density within the pores was measured at 0.6–0.7 g/cm³ and showed a minimum in the pore center, similar to earlier findings in MCM-41. Based on these results, the researchers proposed a new model function to describe the density distribution in MCM-48. The study provides detailed insights into the structural properties of MCM-48 and supports future material design.

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