Grey-scale conversion X-ray mapping by EDS of multielement and multiphase layered microstructures

K V Dahl1, J Hald, A Horsewell

  • 1Department of Manufacturing Engineering and Management, Technical University of Denmark, DTU, Lyngby, Denmark. kvd@ipl.dtu.dk

Journal of Microscopy
|February 9, 2007
PubMed
Summary

A new method converts grey-scale elemental maps from energy dispersive spectroscopy into composition profiles for layered surfaces. This technique offers improved data and faster analysis compared to traditional methods.