Related Experiment Video
Updated: Jul 17, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Published on: July 5, 2016
Grey-scale conversion X-ray mapping by EDS of multielement and multiphase layered microstructures
K V Dahl1, J Hald, A Horsewell
1Department of Manufacturing Engineering and Management, Technical University of Denmark, DTU, Lyngby, Denmark. kvd@ipl.dtu.dk
A new method converts grey-scale elemental maps from energy dispersive spectroscopy into composition profiles for layered surfaces. This technique offers improved data and faster analysis compared to traditional methods.
Area of Science:
- Materials Science
- Analytical Chemistry
- Surface Engineering
Background:
- Layered engineering surfaces, such as MCrAlY coatings on turbine blades, are crucial in high-performance applications.
- Characterizing compositional changes, especially interdiffusion, in these complex microstructures is challenging.
- Traditional point-by-point scans can be time-consuming and may lack sufficient statistical accuracy.
Purpose of the Study:
- To develop a novel procedure for grey-scale conversion of energy dispersive spectroscopy (EDS) X-ray maps.
- To enable accurate plotting of line composition profiles across modified layered engineering surfaces.
- To provide a rapid and statistically improved alternative to existing methods for compositional analysis.
Main Methods:
- Collection of grey-scale elemental maps using EDS.
- Calculation of mean grey-scale levels along defined strips parallel to the layered microstructure.
- Conversion of grey-scale line profiles into quantitative composition line profiles.
Main Results:
- The developed procedure was successfully applied to a plasma-sprayed MCrAlY coating on a nickel-superalloy turbine blade.
- Compositional profiles were accurately obtained for layered microstructures after long-term isothermal heat treatments with significant interdiffusion.
- The method demonstrated significantly improved counting statistics compared to traditional point-by-point scans for equivalent scanning electron microscope time.
Conclusions:
- The grey-scale conversion method is effective for analyzing multielement and multiphase layered microstructures.
- This procedure offers a rapid and accurate alternative to EDS spectrum imaging for compositional profiling.
- The obtained composition profiles facilitate comparison with multicomponent thermodynamic modeling of interdiffusion processes.
More Related Videos
10:12Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
10:42In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
Published on: June 16, 2016
Related Concept Videos
X-ray Imaging
Scanning Electron Microscopy
Fundamental Principles
Accelerated...