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Updated: Jul 14, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A 2 m inelastic X-ray scattering spectrometer at CMC-XOR, Advanced Photon Source
J P Hill1, D S Coburn, Y J Kim
1Department of Condensed Matter Physics and Material Science, Brookhaven National Laboratory, Upton, NY 11973, USA.
Abstract:
The design and commissioning of an inelastic X-ray scattering instrument at CMC-XOR at the Advanced Photon Source is reported. The instrument features a 2 m vertical-scattering arm with a novel counterweight design to reduce the twisting moment as the arm is moved in the scattering plane. A Ge(733) spherical analyzer was fabricated and an overall resolution of 118 meV (FWHM) was obtained with a Si(444) monochromator and a Si(111) pre-monochromator. Early results from a representative cuprate, La(2)CuO(4), are reported.
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