William C Warger1, Charles A DiMarzio
1Department of Electrical and Computer Engineering, The Bernard M. Gordon Center for Subsurface Sensing and ImagingSystems (Gordon-CenSSIS), Northeastern University, Boston, Massachusetts 02115, USA. wwarger@ece.neu.edu
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A new confocal reflectance microscope uses a compact dual-wedge scanner for smaller, efficient imaging. This innovation achieves high-resolution imaging and optical sectioning, advancing microscopy technology.
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