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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Refraction and scattering of X-rays in analyzer-based imaging
Heikki Suhonen1, Manuel Fernández, Alberto Bravin
1Department of Physical Sciences, PL 64, FIN-00014 Helsinki University, Finland. heikki.suhonen@helsinki.fi
Journal of Synchrotron Radiation
|October 26, 2007
Summary
A new algorithm separates scattered and non-scattered synchrotron radiation beams. This method accurately quantifies absorption, refraction, and scattering effects in samples.
Area of Science:
- Materials Science
- Crystallography
- Optics
Background:
- Synchrotron radiation analysis is crucial for material characterization.
- Separating scattered and non-scattered beam components is essential for accurate analysis.
- Existing methods may lack precision in quantifying complex beam interactions.
Purpose of the Study:
- Introduce a novel algorithm for separating scattered and non-scattered synchrotron radiation.
- Quantify absorption, refraction, and scattering effects in transmitted samples.
- Validate the algorithm's performance across various sample properties.
Main Methods:
- Developed a new algorithm utilizing pseudo-Voigt functions to fit observed rocking curves.
- Analyzed monochromatic, collimated synchrotron radiation reflected from a perfect crystal.
- Separated beam intensity into scattered and non-scattered components.
Main Results:
- The algorithm accurately separates beam components and quantifies absorption and refraction.
- Achieved precise fits over an angular range 15 times the analyzer's rocking curve width.
- Scattering exhibits long, Lorentzian-shaped tails due to the experimental geometry.
- Scattering and rocking curve moments increase linearly with sample thickness, creating identical scattering maps.
- Geometrical optics approximation shows good agreement for refraction effects.
Conclusions:
- The new algorithm provides a robust method for analyzing synchrotron radiation beam interactions.
- Quantitative mapping of absorption, refraction, and scattering is now more precise.
- The method is efficient, yielding similar results even with a reduced data set.
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