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Updated: Jul 10, 2026
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Spectral Reflectometric Microscopy on Myelinated Axons In Situ
Published on: July 2, 2018
Spectral self-interference microscopy for low-signal nanoscale axial imaging
Brynmor J Davis1, Anna K Swan, M Selim Unlü
1Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois 61801, USA. bryn@uiuc.edu
Summary
Spectral self-interference microscopy (SSM) advancements enable low-signal imaging for single-molecule studies. New methods demonstrate nanometer axial localization and robust data processing for broader SSM applications.
Area of Science:
- Optics and Photonics
- Biophysics
- Spectroscopy
Background:
- Spectral Self-Interference Microscopy (SSM) offers unique capabilities for nanoscale imaging.
- Current limitations hinder SSM application in low-light conditions, such as single-molecule detection.
Purpose of the Study:
- To expand the applicability of SSM, particularly for low-signal environments like single-molecule studies.
- To develop a comprehensive theoretical and numerical framework for SSM.
Main Methods:
- Developed a comprehensive electromagnetic model for SSM accommodating various experimental parameters.
- Investigated an evanescently excited SSM system using Monte Carlo simulations.
- Proposed a noise-robust data-processing method for spectral envelope uncertainties.
Main Results:
- Demonstrated nanometer-scale axial localization for single-emitter objects in low-signal conditions.
- Successfully imaged arbitrary fluorophore distributions and two-emitter objects.
- Validated the robustness of the data-processing method against noise.
Conclusions:
- The enhanced SSM framework significantly broadens its application scope.
- Achieved high-precision localization and imaging in challenging low-signal scenarios.
- The developed methods pave the way for advanced SSM applications in biophysics and materials science.
