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Related Experiment Videos

Spatial distribution maps for atom probe tomography.

Brian P Geiser1, Thomas F Kelly, David J Larson

  • 1Imago Scientific Instruments Corporation, 5500 Nobel Drive, Madison, Wisconsin 53711-4951, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 16, 2007
PubMed
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Spatial distribution maps (SDM) offer a real-space technique for detailed structural analysis in atom probe tomography. This method reveals crystal lattices, corrects image distortions, and quantifies various material properties.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Analytical Chemistry

Background:

  • Atom probe tomography (APT) provides 3D atomic-scale chemical and structural information.
  • Interpreting complex APT datasets requires advanced analytical techniques.
  • Real-space analysis methods are crucial for understanding nanoscale structures.

Purpose of the Study:

  • To introduce and describe a real-space technique called spatial distribution maps (SDM).
  • To explain the underlying mechanics of the SDM technique.
  • To demonstrate the broad applicability of SDM in atom probe tomography.

Main Methods:

  • Development of the spatial distribution maps (SDM) technique for real-space analysis.
  • Application of SDM to various test cases within atom probe tomography.

Related Experiment Videos

  • Detailed explanation of the computational and analytical procedures involved in SDM.

    • Main Results:

    • SDM successfully identifies crystal lattices and corrects lattice strains in reconstructed APT images.
    • The technique quantifies trajectory aberrations, spatial resolution, and chemical ordering.
    • SDM enables dark-field imaging, determination of orientation relationships, and extraction of radial distribution functions.

    Conclusions:

    • Spatial distribution maps (SDM) are a versatile real-space tool for atom probe tomography.
    • SDM enhances the structural and chemical analysis capabilities of APT data.
    • The technique provides quantitative insights into material properties at the atomic scale.