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Updated: Jul 8, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Compact soft x-ray spectrometer for plasma diagnostics at the Heidelberg Electron Beam Ion Trap
A Lapierre1, J R Crespo López-Urrutia, T M Baumann
1Max-Planck Institut für Kernphysik, Saupfercheckweg 1, D-69117 Heidelberg, Germany.
Abstract:
A compact flat-field soft x-ray grazing-incidence grating spectrometer equipped with a cryogenically cooled back-illuminated charge-coupled device camera was built and implemented at the Heidelberg Electron Beam Ion Trap. The instrument spans the spectral region from 1 to 37 nm using two different gratings. In slitless operation mode, it directly images a radiation source, in this case ions confined in an electron beam ion trap, with high efficiency and reaching hereby a resolving power of lambda/Deltalambda approximately =130 at 2 nm and of lambda/Deltalambda approximately =600 at 28 nm. Capable of automatized operation, its low noise and excellent stability make it an ideal instrument not only for spectroscopic diagnostics requiring wide spectral coverage but also for precision wavelength measurements.
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