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Longitudinal-mode-partition noise in a semiconductor-laser-based interferometer.

S Inoue, Y Yamamoto

    Optics Letters
    |March 1, 1997
    PubMed
    Summary
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    We discovered periodic noise variations in a Mach-Zehnder interferometer linked to semiconductor laser modes. This noise, caused by mode partition noise, significantly exceeded the shot-noise level.

    Area of Science:

    • Optics and Photonics
    • Semiconductor Lasers
    • Interferometry

    Background:

    • Mach-Zehnder interferometers are sensitive optical devices.
    • Semiconductor lasers exhibit complex mode structures.
    • Intensity noise is a critical parameter in optical measurements.

    Purpose of the Study:

    • To investigate the source of periodic intensity-noise variations in a Mach-Zehnder interferometer.
    • To correlate noise patterns with semiconductor laser characteristics.
    • To identify the origin of excess noise in bright fringe conditions.

    Main Methods:

    • Utilizing a Mach-Zehnder interferometer with adjustable arm-length difference.
    • Analyzing intensity-noise variations as a function of optical path difference.

    Related Experiment Videos

  • Comparing observed noise periods with semiconductor laser longitudinal-mode separation.

    • Main Results:

    • Observed periodic intensity-noise variations in the interferometer output.
    • Found the noise variation period matched the semiconductor laser's longitudinal-mode separation.
    • Identified longitudinal-mode partition noise as the source of excess noise (approx. 30 dB above shot-noise).

    Conclusions:

    • Selective destructive interference of side modes in semiconductor lasers causes significant excess noise in Mach-Zehnder interferometers.
    • Understanding mode partition noise is crucial for high-precision interferometric measurements.
    • The study elucidates a key noise mechanism impacting optical sensing and metrology.