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Ultrafast x-ray diffraction using a streak-camera detector in averaging mode.

J Larsson, Z Chang, E Judd

    Optics Letters
    |July 1, 1997
    PubMed
    Summary
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    We developed a new apparatus for time-dependent X-ray diffraction measurements using an X-ray streak camera with picosecond resolution. This system precisely measures X-ray pulse durations from synchrotrons.

    Area of Science:

    • Physics
    • Materials Science
    • Instrumentation

    Background:

    • Time-resolved X-ray diffraction is crucial for studying dynamic processes.
    • Existing methods may lack the necessary temporal resolution for ultrafast phenomena.

    Purpose of the Study:

    • To demonstrate a novel apparatus for high-resolution, time-dependent X-ray diffraction measurements.
    • To achieve single-shot temporal resolution better than 1 picosecond.

    Main Methods:

    • Utilizing synchrotron X-ray pulses diffracted by silicon crystals.
    • Employing an X-ray streak camera triggered by femtosecond laser pulses.
    • Synchronizing laser, streak camera, and synchrotron pulses.

    Main Results:

    Related Experiment Videos

  • Achieved single-shot temporal resolution better than 1 picosecond.
  • Demonstrated 2-picosecond temporal resolution in averaging mode.
  • Measured a 70-picosecond duration for 5-keV X-ray pulses from the Advanced Light Source synchrotron.

    • Conclusions:

    • The developed apparatus enables precise measurement of time-dependent X-ray diffraction.
    • The system offers high temporal resolution for characterizing X-ray pulses.