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Updated: Jul 7, 2026

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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Correlation between He-Ne scatter and 2.7-microm pulsed laser damage at coating defects
J O Porteus1, C J Spiker, J B Franck
1Naval Weapons Center, Physics Division, Michelson Laboratory, China Lake, California 93555-6001, USA.
Applied Optics
|November 1, 1986
Summary
Pulsed laser damage in infrared mirror coatings correlates with scatter from defects before damage occurs. This finding supports using scatter probes for nondestructive defect detection and quality control in optical coatings.
Area of Science:
- Materials Science
- Optical Engineering
- Laser Physics
Background:
- A correlation between defect-initiated pulsed laser damage and local predamage scatter in multilayer infrared mirror coatings has been reported.
- This phenomenon is crucial for understanding optical coating reliability.
Purpose of the Study:
- To analyze in detail the correlation between defect-initiated pulsed laser damage and local predamage scatter in multilayer infrared mirror coatings.
- To confirm previous findings using a larger dataset and varied conditions.
Main Methods:
- Utilized a He-Ne scatter probe to detect scatter signals from individual undamaged defects.
- Performed damage frequency measurements (1-on-1) using 100-ns pulses at 2.7-microm wavelength.
- Compared scatter signals with damage initiation sites and analyzed focal spot intensity profiles.
Main Results:
- Confirmed a strong correlation between increased predamage scatter signals and higher damage frequency.
- Demonstrated equivalence in defect densities indicated by scatter and damage probes.
- Identified conditions limiting the correlation, such as variable scatter and background scatter.
Conclusions:
- The study confirms the link between defect scatter and laser-induced damage in infrared mirror coatings.
- Results suggest scatter probes are viable for nondestructive defect detection.
- Findings have implications for improving optical coating quality control and reliability.
