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Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for

Etienne Dague1, Arnaud Delcorte, Jean-Paul Latgé

  • 1Unité de Chimie des Interfaces, Université Catholique de Louvain, Croix du Sud 2/18, B-1348 Louvain-la-Neuve, Belgium. dufrene@cifa.ucl.ac.be

Langmuir : the ACS Journal of Surfaces and Colloids
|February 2, 2008
PubMed

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