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Small element array algorithm for correcting phase aberration using near-field signal redundancy. I. Principles.
Y Li1
1CSIRO Telecommunication and Industrial Physics, West Lindfield, NSW, Australia. yue.li@tip.csiro.a
Summary
A new algorithm measures phase aberrations in small element arrays by using subarrays to narrow beams. This method enables angle-dependent aberration profiling and analyzes signal similarities for improved near-field measurements.
Area of Science:
- Array signal processing
- Near-field acoustics
- Phase aberration measurement
Background:
- Previous algorithms were designed for large element arrays, limiting their application.
- Measuring phase aberrations is crucial for accurate imaging and signal focusing.
Purpose of the Study:
- To propose a novel near-field signal-redundancy algorithm for small element arrays.
- To enable the measurement of angle-dependent phase-aberration profiles.
- To analyze and compare methods for dynamic near-field delay correction.
Main Methods:
- Forming subarrays of adjacent elements to narrow beams.
- Collecting common midpoint signals with steered beams.
- Analyzing signal similarity using the corresponding-signal concept.
Main Results:
- The proposed algorithm effectively measures angle-dependent phase aberrations in small element arrays.
- Subarray formation allows for beam narrowing and steering, crucial for detailed profiling.
- Analysis of delay correction methods provides insights into signal similarity.
Conclusions:
- The developed algorithm extends phase aberration measurement to small element arrays.
- The corresponding-signal concept offers a valid framework for analyzing delay correction methods.
- This work advances near-field measurement techniques for diverse signal processing applications.

