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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Wide band focusing x-ray spectrograph with spatial resolution
S A Pikuz1, J D Douglass, T A Shelkovenko
1Cornell University, Ithaca, NY 14853, USA.
The Review of Scientific Instruments
|February 6, 2008
Summary
A novel wide-bandwidth focusing spectrograph with spatial resolution (WB-FSSR) offers versatile X-ray diagnostics. This instrument provides high spectral and spatial resolution for various experimental needs.
Area of Science:
- Plasma physics
- X-ray spectroscopy
- Astrophysics
Background:
- X-ray spectrographs are crucial for plasma diagnostics.
- Existing instruments may lack the flexibility for diverse experimental requirements.
- The need for high-resolution, wide-bandwidth X-ray diagnostics is persistent.
Purpose of the Study:
- To introduce and describe a new wide-bandwidth focusing spectrograph with spatial resolution (WB-FSSR).
- To demonstrate the WB-FSSR's capability for routine diagnostic applications across varying spectral needs.
- To evaluate the spectral and spatial resolution of the WB-FSSR.
Main Methods:
- Development of the wide-bandwidth focusing spectrograph with spatial resolution (WB-FSSR) utilizing spherically bent mica crystals.
- Combining three crystals to create a large aperture dispersive element for wide spectral bandwidth.
- Testing the WB-FSSR on a pulsed power machine during imploding wire-array experiments.
Main Results:
- Successful recording of X-ray spectra in the 1-20 Å band using different orders of mica crystal reflection.
- Demonstration of spectral resolution of approximately 2000.
- Achieved spatial resolution of approximately 100 micrometers in the 5-10 Å spectral band (second order reflection).
- Distinguishing real spectral shifts from those caused by plasma spatial distribution using a two-mirror configuration.
Conclusions:
- The WB-FSSR is a versatile diagnostic tool suitable for experiments requiring different spectral coverages.
- The instrument achieves high spectral and spatial resolution, enabling detailed plasma characterization.
- A proposed numerical analysis method aids in assessing spectrograph capabilities.
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