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Novel HDD-type SNDM ferroelectric data storage system aimed at high-speed data transfer with single probe operation
Yoshiomi Hiranaga1, Tomoya Uda, Yuichi Kurihashi
1Research Institute of Electrical Communication, Tohoku University, Aoba-ku, Sendai, Japan. hiranaga@riec.tohoku.ac.jp
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|February 16, 2008
Summary
This study introduces a novel ferroelectric data storage test system for high-speed data transfer. The system achieves 100 kbps read speeds and 10 Mbps write speeds, addressing probe abrasion with advanced height control.
Area of Science:
- Materials Science
- Electrical Engineering
- Data Storage Technology
Background:
- Ferroelectric materials offer promising non-volatile memory capabilities.
- High-speed data transfer in ferroelectric storage systems faces challenges like probe wear and signal integrity.
- Existing test systems may not fully address the demands of rapid read/write operations.
Purpose of the Study:
- To develop and evaluate a novel ferroelectric data storage test system.
- To investigate high-speed data transfer capabilities for both reading and writing operations.
- To address and mitigate issues related to probe abrasion during high-speed scanning.
Main Methods:
- Utilized a novel ferroelectric data storage test system with a spindle motor and single probe head.
- Conducted read/write tests at various data transfer rates.
- Implemented a noncontact probe height control technique.
- Analyzed the impact of dc-offset voltage on writing waveforms during high-speed scanning.
Main Results:
- Successfully read periodically inverted signals at a bit rate of 100 kbps.
- Achieved data transfer rates of 10 Mbps during writing operations.
- Demonstrated the effectiveness of the noncontact probe height control in preventing tip abrasion.
- Identified the influence of dc-offset voltage on writing performance.
Conclusions:
- The novel test system enables high-speed ferroelectric data storage.
- The implemented techniques enhance system reliability and data transfer efficiency.
- Further research can optimize parameters for even greater performance.
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