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Updated: Jul 6, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Single device for laser source measurements from the ultraviolet to the far infrared
1Department of Physics, University of Bucharest, PO Box MG-11, 76900 Bucharest, Romania. mdragoman@hotmail.com
Abstract:
We propose a new device, based on an array of micromechanical cantilevers, that measures both the wavelength and the optical power of a laser source with constant efficiency over a large spectral interval from the ultraviolet to the far infrared. To measure the wavelength, the thickness of the cantilevers must vary linearly along the array. The characteristics of this device are calculated, and an example is given for the design of an array of Si cantilevers that cover the 0.33-11-microm spectral range.
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The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...

