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Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
Published on: December 7, 2017
Strain-driven electronic band structure modulation of si nanowires
Ki-Ha Hong1, Jongseob Kim, Sung-Hoon Lee
1Samsung Advanced Institute of Technology, Mt. 14-1, Nongseo-Dong, Giheung-Gu, Yongin-Si, Gyeonggi-Do, 446-712, Korea. kiha.hong@samsung.com
Nano Letters
|April 12, 2008
Summary
Controlling silicon nanowire band gaps is key for photonic devices. Uniaxial strain modulates band structure, with effects varying by crystal orientation and diameter, offering new engineering possibilities.
Area of Science:
- Materials Science
- Nanotechnology
- Condensed Matter Physics
Background:
- Silicon nanowires (SiNWs) are crucial for advanced photonic devices.
- Achieving a direct band gap in SiNWs remains a significant challenge.
- Band structure control is essential for optimizing SiNW optoelectronic properties.
Purpose of the Study:
- To present a novel strategy for controlling the electronic band structure of SiNWs.
- To investigate the impact of uniaxial strain on SiNW band gaps.
- To analyze the dependence of strain effects on SiNW crystal orientation and diameter.
Main Methods:
- Theoretical analysis of band structure modulation under uniaxial strain.
- Investigation of strain effects across different SiNW crystal orientations ([100], [111], [110]).
- Correlation of strain-induced band gap changes with SiNW diameter and bulk silicon band features.
Main Results:
- Uniaxial strain effectively modulates the electronic band structure of SiNWs.
- Tensile strain enhances direct band gap characteristics in [100] and [111] SiNWs.
- Compressive strain and both tensile/compressive strain in [110] SiNWs lead to indirect band gaps.
Conclusions:
- Strain-induced band structure modulation is highly dependent on SiNW crystal orientation and diameter.
- This strain engineering approach offers a pathway for developing SiNW-based nanoscale devices.
- Understanding strain effects is vital for future SiNW band structure engineering and device analysis.

