Damage effects induced by electrically generated negative air ions in Caenorhabditis elegans

Kezhou Cai1, Xuelan Liu, Yongjian Xu

  • 1Key Laboratory of Ion Beam Bioengineering, Institute of Plasma Physics, Chinese Academy of Sciences, Hefei, Anhui 230031, PR China.

Summary

Electrically generated negative air ions (ENIs) exposure damages Caenorhabditis elegans by shortening lifespan and increasing cell death. Reactive oxygen species (ROS) play a key role in these harmful effects.

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