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Related Experiment Videos

Breakdown limits on Gigavolt-per-meter electron-beam-driven wakefields in dielectric structures.

M C Thompson1, H Badakov, A M Cook

  • 1Department of Physics and Astronomy, University of California, Los Angeles, California 90095, USA. dr.mcthompson@gmail.com

Physical Review Letters
|June 4, 2008
PubMed
Summary
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Researchers measured the dielectric breakdown threshold using high-energy electron bunches. Breakdown occurred at 13.8 GV/m, establishing a critical field for wakefield acceleration structures.

Area of Science:

  • Materials Science
  • Particle Accelerators
  • Plasma Physics

Background:

  • Dielectric materials are crucial for high-gradient accelerating structures.
  • Understanding breakdown thresholds is essential for designing future particle accelerators.
  • Wakefield acceleration relies on intense electric fields generated by particle beams.

Purpose of the Study:

  • To measure the dielectric breakdown threshold in fused silica under high GV/m wakefields.
  • To determine the critical electric field strength at which breakdown occurs.
  • To correlate structural damage with beam-induced breakdown phenomena.

Main Methods:

  • Exposure of fused silica tubes (100 microm inner diameter) to 28.5 GeV electron bunches of varying lengths (30-330 fs).
  • Generation of surface dielectric fields up to 27 GV/m.

Related Experiment Videos

  • Detection of breakdown onset via light emission and post-exposure inspection techniques.

    • Main Results:

    • The first measurements of dielectric breakdown threshold under GV/m wakefields were performed.
    • Breakdown onset was observed at a peak electric field of 13.8 ± 0.7 GV/m.
    • Correlation between structural damage and beam-induced breakdown was established.

    Conclusions:

    • The study establishes a precise breakdown threshold for fused silica in high-gradient accelerator applications.
    • Findings are critical for the design and optimization of dielectric-based accelerating structures.
    • The research provides insights into material failure mechanisms under intense electromagnetic fields.