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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Breakdown limits on Gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

M C Thompson1, H Badakov, A M Cook

  • 1Department of Physics and Astronomy, University of California, Los Angeles, California 90095, USA. dr.mcthompson@gmail.com

Physical Review Letters
|June 4, 2008
PubMed

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