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DNA adsorption at functionalized Si/buffer interfaces studied by x-ray reflectivity.

C Douarche¹, R Cortès, C Henry de Villeneuve

¹Physique de la Matière Condensée, Ecole Polytechnique, CNRS, 91128 Palaiseau, France.

The Journal of Chemical Physics

|June 17, 2008

Summary

DNA adsorption on silicon surfaces depends on its structure. Double-stranded DNA deforms the surface layer, unlike single-stranded DNA, indicating irreversible binding and potential dehydration.

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Area of Science:

Surface Science
Biophysics
Materials Science

Background:

Understanding DNA adsorption is crucial for biosensors and nanotechnology.
Chemically functionalized silicon surfaces offer tunable properties for biomolecule immobilization.

Purpose of the Study:

To investigate the adsorption behavior of double-stranded DNA (dsDNA) and single-stranded DNA (ssDNA) on functionalized silicon surfaces.
To characterize the structural changes induced by DNA adsorption using X-ray reflectivity.

Main Methods:

X-ray reflectivity measurements to analyze surface density profiles.
Covalent grafting of aminated alkyl-chain monolayers on oxide-free silicon.
Infrared spectroscopy for surface characterization.

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Main Results:

dsDNA adsorption induced a measurable deformation in the aminated monolayer, unlike ssDNA.
Surface densities of grafted monolayers were consistent with spectroscopic data.
Adsorbed dsDNA exhibited irreversible binding at high salt concentrations, suggesting dehydration.

Conclusions:

The deformation of the molecular monolayer is a key indicator of dsDNA adsorption.
Irreversible binding and potential dehydration of dsDNA are significant findings for surface interactions.
This study provides quantitative insights into DNA-surface interactions on functionalized silicon.