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Updated: Jul 4, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
1School of Electrical Engineering and Computer Science, University of Newcastle, Callaghan, NSW 2308, Australia. Andrew.Fleming@newcastle.edu.au
Charge drives offer a simple solution for piezoelectric actuator control in scanning probe microscopy, reducing hysteresis errors to under 1% without complex feedback systems, enabling high-speed imaging.
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