Semiconductors
Types of Semiconductors
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
Types Of Superconductors
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Alfred J Baca1, Jong-Hyun Ahn, Yugang Sun
1Department of Chemistry and Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA.
Researchers are developing high-performance inorganic semiconductor materials for flexible electronics. This review covers their fabrication, assembly on plastic substrates, and mechanical properties for advanced applications.
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