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Published on: August 22, 2017
Phase retrieval from a single near-field diffraction pattern with a large Fresnel number
Enrong Li1, Yijin Liu, Xiaosong Liu
1Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Beijing, China.
Summary
A novel phase retrieval method uses oversampled diffraction patterns from a single image. This technique reconstructs objects without needing object envelope information, even with noisy data.
Area of Science:
- Optics and Photonics
- Computational Imaging
- Diffraction Physics
Background:
- Phase retrieval is crucial for reconstructing objects from diffraction data.
- Traditional methods often require multiple measurements or prior information.
- Near-field diffraction imaging presents unique challenges, especially with large Fresnel numbers.
Purpose of the Study:
- To introduce a new phase retrieval method for single near-field diffraction images.
- To demonstrate the method's ability to work with large Fresnel numbers.
- To validate the method's robustness against noise and computational efficiency.
Main Methods:
- Utilizing a single, oversampled near-field diffraction pattern.
- Developing a phase retrieval algorithm that does not require object envelope information.
- Integrating a fast computational approach for integer oversampling ratios.
Main Results:
- Successful phase retrieval from a single diffraction image with a large Fresnel number.
- Demonstrated independence from object envelope information.
- Validation of the method's performance with noisy data through numerical simulations.
- Compatibility with fast computational methods under specific oversampling conditions.
Conclusions:
- The proposed method offers a simplified and effective approach to phase retrieval.
- It expands the applicability of phase retrieval to scenarios with limited information.
- The method shows promise for practical applications in imaging and microscopy.
