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Related Concept Videos

Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Published on: July 3, 2021

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.

Mitsuhiro Saito1, Koji Kimoto, Takuro Nagai

  • 1Advanced Nano Characterization Center, National Institute for Materials Science, Tsukuba, Ibaraki, Japan.

Journal of Electron Microscopy
|November 27, 2008
PubMed
Summary

We developed a scanning transmission electron microscopy method for precise crystal structure analysis. This technique achieves 10-pm accuracy, enabling detailed examination of atomic displacements and material properties.

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Last Updated: Jun 27, 2026

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Area of Science:

  • Materials Science
  • Solid State Physics
  • Nanotechnology

Background:

  • Precise local crystal structure analysis is crucial for understanding material properties.
  • Scanning transmission electron microscopy (STEM) offers high spatial resolution for materials characterization.

Purpose of the Study:

  • To demonstrate local crystal structure analysis using annular dark-field (ADF) imaging in STEM.
  • To achieve high accuracy in elemental discrimination and atom-position determination for advanced materials.

Main Methods:

  • Utilizing a stabilized STEM instrument with customized software.
  • Employing annular dark-field (ADF) imaging for atomic-scale analysis.
  • Analyzing A-site ordered/disordered perovskite manganites (Tb(0.5)Ba(0.5)MnO(3)).

Main Results:

  • Achieved 10-pm order accuracy in elemental discrimination and atom-position determination.
  • Detected A-site ordering and a 12-pm Mn-site displacement in Tb(0.5)Ba(0.5)MnO(3).
  • Demonstrated the capability to reveal cation displacements linked to ferroelectricity and colossal magnetoresistivity.

Conclusions:

  • The developed ADF-STEM method enables precise local crystal structure analysis.
  • This technique is applicable to advanced materials, including strongly correlated electron systems.
  • Accurate atomic-level characterization can elucidate structure-property relationships.