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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
10-fold detection range increase in quadrant-photodiode position sensing for photonic force microscope.
Sandro Perrone1, Giovanni Volpe, Dmitri Petrov
1ICFO-Institut de Ciencies Fotoniques, Mediterranean Technology Park, Castelldefels (Barcelona) 08860, Spain.
The Review of Scientific Instruments
|December 3, 2008
Summary
We enhanced position sensing for photonic force microscopy using quadrant photodetectors (QPDs). Our novel technique increases the detection range by tenfold, improving probe displacement measurements.
Area of Science:
- Optics and Photonics
- Nanotechnology
- Microscopy
Background:
- Photonic force microscopy (PFM) is crucial for nanoscale force measurements.
- Quadrant photodetectors (QPDs) are standard sensors in PFM for probe displacement detection.
- Current QPD-based PFM systems have limited detection ranges, restricting their application scope.
Purpose of the Study:
- To develop a technique for significantly extending the detection range of QPDs in PFM.
- To overcome the limitations of linear response assumptions in QPD signal processing.
- To improve the sensitivity and applicability of photonic force microscopy.
Main Methods:
- Utilizing the inherent cross-talk between QPD output signals.
- Developing a non-linear signal processing method for QPD outputs.
- Implementing the technique on a PFM setup with a trapped polystyrene sphere probe.
Main Results:
- Achieved a tenfold increase in the position sensing detection range.
- Extended the detection range from 150 nm to 1400 nm.
- Demonstrated the technique's effectiveness with a 300 nm radius polystyrene sphere probe.
Conclusions:
- The proposed technique effectively enhances the detection range of QPDs in PFM.
- This advancement broadens the operational capabilities of photonic force microscopy.
- Non-linear signal analysis of QPD cross-talk offers a powerful method for improving sensor performance.

